High-pressure X-ray diffraction study of InAs

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 200, Issue , 2003, Pages 90-94

  Aquilanti, G ^a   Crichton, W A ^a   Le Bihan, T ^a   Pascarelli, S ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

High pressure; III V semiconductors; Phase transition; X ray diffraction

Indexed keywords

DATA REDUCTION; PHASE TRANSITIONS; PHONONS; SEMICONDUCTING INDIUM COMPOUNDS; SILICONES; X RAY DIFFRACTION;

PRESSURE TRANSMITTING MEDIA (PTM);

HIGH PRESSURE EFFECTS;

EID: 0037243839     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01680-4     Document Type: Conference Paper

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