CCD or CMOS camera noise characterisation

EPJ Applied Physics

Volumn 21, Issue 1, 2003, Pages 75-80

  Reibel, Y ^a   Jung, M ^a   Bouhifd, M ^a   Cunin, B ^a   Draman, C ^a  

^a Faculté de Médecine   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; NUMERICAL METHODS; PHOTONS; SPURIOUS SIGNAL NOISE;

CCD CAMERAS; PATTERN NOISE; PHOTON TRANSFER;

CAMERAS;

EID: 0037243268     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2002103     Document Type: Article

References (11)

1. J. Janesick, K. Klaasen, T. Elliot, Opt. Eng. 26, 10 (1987)
2. G.C. Holst, CCD arrays, cameras and displays, SPIE (Optical Engineering Press, Washington, 1998)
3. P. Seitz, Proc. SPIE 3099, 22 (1997)
4. Michael J. Demler, High-speed analog-to-digital conversion (Academic Press, 1991)
5. J. Janesick, Proc. SPIE 3019, 70 (1997)
6. J.M. Mooney, Appl. Opt. 30, 3324 (1991)
7. J.M. Mooeny, F.D. Shepherd, W.S. Ewing, J.E. Murguia, J. Silverman, Opt. Eng. 28, 1151 (1989)
8. M. Jung, Y. Reibel, B. Cunin, C. Draman, IEEE Trans. Circuits Syst. II 47, 958 (2000)
9. A. Papoulis, Probability, Random Variables, And Stochastic Processes (McGraw-Hill, NY, 1991)
10. Kodak, Application note DS00-001 (1994)
11. N. Hassen, M. Jung, B. Cunin, Eur. Phys. J. AP 5, 209 (1999)