Mechanical testing device for in situ experiments on reversibility of dislocation motion in silicon

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 200, Issue , 2003, Pages 339-345

  Feiereisen, J P ^a   Ferry, O ^a   Jacques, A ^a   George, A ^a  

^a INSTITUT JEAN LAMOUR   (France)

Author keywords

Dislocations; In situ experiments; Reversibility; Silicon; X ray topography

Indexed keywords

CAMERAS; COMPACTION; DISLOCATIONS (CRYSTALS); HIGH TEMPERATURE EFFECTS; MECHANICAL TESTING; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

STRESS REVERSAL;

SILICON;

EID: 0037241606     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01698-1     Document Type: Conference Paper

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