High-resolution texture imaging with hard synchrotron radiation in the moving area detector technique

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 199, Issue , 2003, Pages 38-43

  Wcislak, L ^a   Bunge, H J ^b   Klein, H ^c   Garbe, U ^a   Schneider, J R ^a  

^a DESY   (Germany)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Hard X ray polycrystal diffraction; High energy synchrotron radiation; Moving detector mode; Texture analysis

Indexed keywords

IMAGE ANALYSIS; IMAGING TECHNIQUES; POLYCRYSTALS; RECRYSTALLIZATION (METALLURGY); SYNCHROTRON RADIATION; TEXTURES; X RAY DIFFRACTION ANALYSIS;

HIGH-RESOLUTION TEXTURE IMAGING;

POLYCRYSTALLINE MATERIALS;

EID: 0037238030     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01411-8     Document Type: Conference Paper

References (10)

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4. Bunge H.J., Schwarzer R. Texture and Anisotropy of Polycrystals. 1997;Trans Tech Publications, Zurich.
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6. Schwarzer R. Textures and Microstruct. 13:1990;15.
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9. L. Wcislak, H. Klein, H.J. Bunge, T. Tschentscher, J.R. Schneider, HASYLAB Annual Report, 2000.
10. Wcislak L., Bunge H.J., Klein H., Garbe U., Schneider J.R. J. Appl. Crystallogr. 35:2002;82.