An EXAFS and XANES study of MBE grown Cu-doped ZnO

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 199, Issue , 2003, Pages 190-194

  Fons, P ^a   Yamada, A ^a   Iwata, K ^a   Matsubara, K ^a   Niki, S ^a   Nakahara, K ^b   Takasu, H ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b ROHM CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

X-RAY NEAR-EDGE ABSORPTION (XANES);

ZINC OXIDE;

EID: 0037237997     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01553-7     Document Type: Conference Paper

References (4)

1. Mollwo E., Müller G., Wagner P. Solid State Comm. 13:1973;1283.
2. Bianconi A. Chemical Analysis v. 57: X-ray Absorption. 1988;573 John Wiley & Sons, New York.
3. Fons P., Iwata K., Yamada A., Matsubara K., Niki S. Appl. Phys. Lett. 77:2000;1801.
4. Ankudinov A.L., Ravel B., Rehr J.J., Conradson S.D. Phys. Rev. B. 58:1998;7565.