Uncertainty modelling using Dempster-Shafer theory for improving detection of weld defects

Pattern Recognition Letters

Volumn 24, Issue 1-3, 2003, Pages 547-564

  Kaftandjian, Valérie ^a   Dupuis, Olivier ^a   Babot, Daniel ^a   Zhu, Yue Min ^b  

^a UNIVERSITÉ DE LYON   (France)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

Dempster Shafer theory; Image segmentation; Modelling; Weld inspection; X ray imaging

Indexed keywords

DEFECTS; FUZZY SETS; INDUSTRIAL APPLICATIONS; WELDING;

WELD DEFECTS;

OBJECT RECOGNITION;

DETECTION METHOD;

EID: 0037233378     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(02)00276-3     Document Type: Article

References (9)

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