Characterization of filter radiometers with a wavelength-tunable laser source

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Noorma, M ^a   Toivanen, P ^b   Manoocheri, F ^a   Ikonen, E ^a  

^a AALTO UNIVERSITY   (Finland)

^b Thermo Fisher Scientific Oy   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; CHEMICAL LASERS; COHERENT LIGHT; LASER TUNING; MONOCHROMATORS; REFLECTION; SCANNING;

FILTERS RADIOMETERS; WAVELENGTH TUNABLE LASER SOURCE;

RADIOMETRY;

EID: 0037228070     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

References (11)

1. White M, Fox N P, Ralph V E and Harrison N J 1995/96 Metrologia 32 431-4
2. Brown S W, Eppeldauer G P and Lykke K R 2000 Metrologia 37 579-82
3. Toivanen P, Manoocheri F, Kärhä P, Ikonen E and Lassila A 1999 Appl. Opt. 38 1709-13
4. Lassila A, Toivanen P and Ikonen E 1997 Meas. Sci. Technol. 8 973-7
5. Ikonen E, Toivanen P and Lassila A 1998 Metrologia 35 369-72
6. Schrama C A and Reijn H 1999 Metrologia 36 179-82
7. Schrama C A and van der Ham E W M 2000 Appl. Opt. 39 1500-4
8. Kärhä P, Harrison N J, Nevas S, Hartree W S and Abu-Kassem I 2003 Metrologia 40 S50-54
9. Kärhä P, Haapalinma A, Toivanen P, Manoochehri F and Ikonen E 1998 Metrologia 35 255-9
10. Boivin L P 1989 Absolute Radiometry ed F Hengstberger (San Diego, California: Academic) pp 170-80
11. Kübarsepp T, Kärhä P, Manoocheri F, Nevas S, Ylianttila L and Ikonen E 2000 Metrologia 37 305-12