Determination of thin-film parameters from high accuracy measurements of spectral regular transmittance

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Nevas, S ^a   Manoocheri, F ^a   Ikonen, E ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; DIELECTRIC MATERIALS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; NONLINEAR EQUATIONS; OPTICAL FILMS; REGRESSION ANALYSIS; TANTALUM COMPOUNDS; THIN FILMS;

ALUMINUM DIOXIDE; HIGH ACCURACY MEASUREMENT; NONLINEAR LEAST SQUARES REGRESSIONS; SPECTRAL REGULAR TRANSMITTANCE; TANTALUM PENTOXIDE;

OPTICAL VARIABLES MEASUREMENT;

EID: 0037226288     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

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