Spectral characterization of Ge trap detectors and photodiodes used as transfer standards

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Stock, K D ^a   Heine, R ^a   Hofer, H ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED DETECTORS; LIGHT POLARIZATION; LIGHT REFLECTION; QUANTUM EFFICIENCY; RADIOMETRY; SEMICONDUCTING SILICON; THERMAL EFFECTS;

GERMANIUM TRAP DETECTOR; REFLECTION TRAP DETECTOR; SPECTRAL CHARACTERIZATION; SPECTRAL QUANTUM EFFICIENCY;

PHOTODIODES;

EID: 0037226006     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

References (12)

1. IEC Technical Committee No 86, Working Group 4 Progress Report
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4. Stock K D 1990 Measurement 8 31-4
5. Zalewski E and Duda C R 1983 Appl. Opt. 22 2867-73
6. Fox N P 1991 Metrologia 28 197-202
7. Palmer J M 1993 Metrologia 30 327-33
8. Stock K D and Heine R 2000 Metrologia 37 449-52
9. Goebel R and Stock M 1998 Metrologia 35 413-18
10. López M, Ramos G and Schmid W 2002 Medición de No-linealidad en fotodiodes de Ge e InGaAs a diferentes longitudes de onda y tamaño de haz Proc. Simposio de Metrologia 2002 (Queretaro, Mexico, May 2002)
11. Stock K D 1989 New Developments and Applications in Optical Radiometry ed N P Fox and D H Nettleton (Inst. Phys. Conf. Ser. No 92) (Bristol: IOPP) pp 159-66
12. Stock K D 1988 Appl. Opt. 27 12-14