Mechanical spectroscopy and other relaxation spectroscopies

Solid State Phenomena

Volumn 89, Issue , 2003, Pages 31-66

  Etienne, S ^a,b   Elkoun, S ^a   David, L ^c   Magalas, L B ^d  

^a INSTITUT JEAN LAMOUR   (France)

^b Ecole Europeenne d'Ingenieurs   (France)

^c UNIVERSITÉ DE LYON   (France)

^d AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

Dielectric spectroscopy; Glass transition; Internal friction; Mechanical spectroscopy; Microstructure; Point defects; Relaxation phenomena

Indexed keywords

CRYSTALLINE MATERIALS; DEGREES OF FREEDOM (MECHANICS); GLASS TRANSITION; INTERNAL FRICTION; MICROSTRUCTURE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; POINT DEFECTS; RELAXATION PROCESSES; TEMPERATURE;

DIELECTRIC SPECTROSCOPY; LOW TEMPERATURE RELAXATION PROCESSES; MOLECULAR MOBILITY; NON ELASTIC RADIATION SCATTERING; RELAXATION SPECTROSCOPIES;

SPECTROSCOPY;

EID: 0037224031     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.89.31     Document Type: Conference Paper

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