Intercomparison of radiation temperature measurements over the temperature range from 1600 K to 3300 K

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Khlevnoy, B B ^a   Harrison, N J ^a   Rogers, L J ^a   Pollard, D F ^a   Fox, N P ^a   Sperfeld, P ^b   Fischer, J ^b   Friedrich, R ^b   Metzdorf, Jürgen ^b   Seidel, Joachim ^b   Samoylov, M L ^c   Stolyarevskaya, R I ^c   Khromchenko, V B ^c   Ogarev, S A ^c   Sapritsky, V I ^c  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c All Russian RIOPM (VNIIOFI)   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; GRAPHITE; OPTICAL PROPERTIES; PHOTODIODES; PHOTOMETERS; PYROMETERS; RADIATION; SEMICONDUCTING SILICON;

GLASS FILTER DETECTORS; PYROLYTIC GRAPHITE BLACKBODY; RADIATION TEMPERATURE MEASUREMENT; SPECTRAL RESPONSIVITY;

TEMPERATURE MEASUREMENT;

EID: 0037223957     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

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