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Volumn 217, Issue 1, 2003, Pages 32-42

Goodness of fit: Analysis of residuals

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ERROR ANALYSIS; EXPERIMENTS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; PROBLEM SOLVING; STATISTICAL METHODS;

EID: 0037223381     PISSN: 00222852     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2852(02)00013-9     Document Type: Article
Times cited : (10)

References (13)
  • 3
    • 0003478714 scopus 로고
    • Data reduction and error analysis for the physical sciences
    • McGraw Hill, New York, 1969, New edition with D.K. Robinson, McGraw Hill
    • P.R. Bevington, Data Reduction and Error Analysis for the Physical Sciences, McGraw Hill, New York, 1969, New edition with D.K. Robinson, McGraw Hill (1992).
    • (1992)
    • Bevington, P.R.1
  • 4
    • 85101445097 scopus 로고
    • Applied regression analysis
    • Wiley, New York
    • N.R. Draper, H. Smith, Applied Regression Analysis, Wiley, New York, 1981.
    • (1981)
    • Draper, N.R.1    Smith, H.2
  • 9
    • 0003681739 scopus 로고
    • Robust regression and outlier detection
    • Wiley, New York
    • P.J. Rousseeuw, A.N. Leroy, Robust Regression and Outlier detection, Wiley, New York, 1987.
    • (1987)
    • Rousseeuw, P.J.1    Leroy, A.N.2
  • 11
    • 0012250465 scopus 로고    scopus 로고
    • private communication
    • P. Minguzzi, private communication.
    • Minguzzi, P.1
  • 12
    • 0003663467 scopus 로고
    • Probabilities, random variables and stochastic processes
    • McGraw Hill, New York
    • A. Papoulis, Probabilities, Random Variables and Stochastic Processes, McGraw Hill, New York, 1981.
    • (1981)
    • Papoulis, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.