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Physica C: Superconductivity and its Applications

Volumn 383, Issue 4, 2003, Pages 287-294

Composition depth profiles of superconducting MgB2 thin films determined by ion beam analysis methods

(8) Jergel, Mi a Andrade, E b Chromik, S c Jergel, Ma a Falcony, C a Strbik V c Rocha, M F d Zavala, E P b

a DEPARTAMENTO DE FÍSICA (Mexico)

b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO (Mexico)

c INSTITUTE OF ELECTRICAL ENGINEERING (Slovakia)

d INSTITUTO POLITÉCNICO NACIONAL (Mexico)

Author keywords

Elemental composition; Nuclear reaction method; RBS; Thin MgB2 films

Indexed keywords

ANNEALING; DIFFUSION; EVAPORATION; ION BEAMS; MAGNESIUM COMPOUNDS; MORPHOLOGY; OXIDATION; PHASE COMPOSITION; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTIVITY; X RAY DIFFRACTION ANALYSIS;

ELEMENTAL COMPOSITIONS;

THIN FILMS;

EID: 0037215285 PISSN: 09214534 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4534(02)02255-4 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.