The X-ray characterization of Bi2Sr2CaCu2O8+x single crystals grown by different methods

Physica C: Superconductivity and its Applications

Volumn 383, Issue 4, 2003, Pages 431-437

  Bdikin, I K ^a   Maljuk, A N ^a,b   Kulakov, A B ^a   Lin, C T ^b   Kumar, P ^c   Kumar, B ^c   Trigunayat, G C ^c   Emel'chenko, G A ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c UNIVERSITY OF DELHI   (India)

Author keywords

Bi2Sr2CaCu2O8+x; Methods of crystal growth; Microstructure; X ray topography

Indexed keywords

ANISOTROPY; BISMUTH COMPOUNDS; CRYSTAL GROWTH; CRYSTALLOGRAPHY; SINGLE CRYSTALS; SUPERCONDUCTIVITY; X RAY DIFFRACTION ANALYSIS;

X RAY TOPOGRAPHY;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0037214126     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)01792-6     Document Type: Article

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