Characterization of electro-optic properties of self-assembled monolayer by attenuated total reflection

Optical Materials

Volumn 21, Issue 1-3, 2003, Pages 413-416

  Chang, H J ^a   Ha, N Y ^a   Kim, Ahyoung ^a   Lim, J ^a   Park, Byoungchoo ^a   Park, Eun Jin ^b   Im, Jung Hyuk ^b   Kim, Jae Ho ^b   Lee, Suck Hyun ^b   Wu, J W ^a  

^a Ewha Womans University   (South Korea)

^b Ajou University   (South Korea)

Author keywords

Attenuated total reflection; Electro optic effects; Self assembled monolayer

Indexed keywords

ANISOTROPY; ELECTRIC FIELDS; ELECTROOPTICAL EFFECTS; LIGHT REFLECTION; MONOLAYERS; PERMITTIVITY;

HEMICYANINE PENDENT GROUP;

SELF ASSEMBLY;

EID: 0037211124     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(02)00171-4     Document Type: Conference Paper

References (11)

1. Decher G.et al. Thin Solid Films. 210/211:1992;831.
2. Decher G. Science. 277:1997;1232.
3. Heflin J.R.et al. Appl. Phys. Lett. 74:1999;495.
4. Cross G.H.et al. J. Opt. Soc. Am. B. 4:1987;962.
5. Wijekoon W.M.K.P.et al. Langmuir. 8:1992;135.
6. Cross G.H.et al. Thin Solid films. 136:1988;39.
7. Cross G.H.et al. Electron. Lett. 22:1986;1111.
8. Loulergue J.C.et al. Thin solid films. 160:1988;399.
9. Dentant M.et al. Opt. Commun. 69:1989;379.
10. Im J.-H.et al. Macromolecules. 33:2000;9606.
11. Yoo J.-G.et al. J. Appl. Phys. 84:1998;4079.