A testing-domain-dependent software reliability growth model for imperfect debugging environment and its evaluation of goodness-of-fit

Electronics and Communications in Japan, Part III: Fundamental Electronic Science (English translation of Denshi Tsushin Gakkai Ronbunshi)

Volumn 86, Issue 1, 2003, Pages 11-18

  Fujiwara, Takaji ^a   Yamada, Shigeru ^b  

^a FUJITSU LABORATORIES LTD   (Japan)

^b TOTTORI UNIVERSITY   (Japan)

Author keywords

Imperfect debugging environment; Reliability growth model; Software reliability assessment; Testing domain

Indexed keywords

COMPUTER DEBUGGING; COMPUTER SOFTWARE SELECTION AND EVALUATION; DIFFERENTIAL EQUATIONS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PARAMETER ESTIMATION; PROGRAM DEBUGGING;

NONHOMOGENEOUS POISSON PROCESS; SOFTWARE RELIABILITY GROWTH MODEL;

SOFTWARE ENGINEERING;

EID: 0037210055     PISSN: 10420967     EISSN: None     Source Type: Journal    
DOI: 10.1002/ecjc.10035     Document Type: Article

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