Study of a microprocessor-based technique for improving the uniformity of a field-emission flat-panel display

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 1 SPEC., 2003, Pages 523-526

  Deng, S Z ^a   Wang, K ^a   Chen, Jun ^a   Zhang, Y Q ^a   Xu, N S ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; CURRENT VOLTAGE CHARACTERISTICS; DIGITAL TO ANALOG CONVERSION; FLAT PANEL DISPLAYS; MICROCOMPUTERS; MICROPROCESSOR CHIPS; ULTRAHIGH VACUUM;

CONTROL-VOLTAGE AMPLIFIERS; INPUT-OUTPUT INTERFACE;

FIELD EMISSION DISPLAYS;

EID: 0037207767     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1527600     Document Type: Article

References (11)

1. N. S. Xu, R. V. Latham, and Y. Tzeng, Electron. Lett. 29, 1596 (1993).
2. Q. H. Wang, A. A. Setlur, J. M. Lauerhaas, J. Y. Dai, E. W. Seelig, and R. P. H. Chang, Appl. Phys. Lett. 72, 2912 (1998).
3. J. M. Kim, W. B. Choi, N. S. Lee, and J. E. Jung, Diamond Relat. Mater. 9, 1184 (2000).
4. W. P. Kang, J. L. Davidson, M. Howell, B. Bhuva, D. L. Kinser, D. V. Kerns, Q. Li, and J. F. Xu, J. Vac. Sci. Technol. B 14, 2068 (1996).
5. N. S. Xu, J. C. She, S. E. Huq, J. Chen, and S. Z. Deng, J. Vac. Sci. Technol. B 17, 592 (1999).
6. W. P. Kang, J. L. Davidson, A. Wisitsora-at, D. V. Kerns, and S. E. Kerns, Proceedings of the 13th International Vaccum Microelectronics Conference, 14-17 August 2000, Guangzhou, China, pp. 92-95.
7. W. Z. Li, S. S. Xie, L. X. Qian, B. H. Chang, B. S. Zou, W. Y. Zhou, R. A. Zhao, and G. Wang, Science 274, 1701 (1996).
8. Z. F. Ren, Z. P. Huang, J. W. Xu, J. H. Wang, P. Bush, M. P. Siegal, and P. N. Provencio, Science 282, 1105 (1998).
9. J. Li, C. Papadopoulos, J. M. Xu, and M. Moskovits, Appl. Phys. Lett. 75, 367 (1999).
10. J. Chen, S. Z. Deng, and N. S. Xu, Proceedings of the 47th International Field Emission Symposium, 29 July-3 August 2001, Berlin, Germany, EP. 17.
11. S. Z. Deng, F. Qian, N. S. Xu, and J. Chen, Ultramicroscopy 89, 123 (2001).