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Volumn 1564, Issue 2, 2002, Pages 466-472
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Alterations of wheat root plasma membrane lipid composition induced by copper stress result in changed physicochemical properties of plasma membrane lipid vesicles
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Author keywords
Copper stress; EPR; Plasma membrane; Vesicle permeability; Wheat root
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Indexed keywords
COPPER;
GLUCOSE;
LIPID;
PHOSPHATIDYLCHOLINE;
PROTON;
STEARIC ACID DERIVATIVE;
ARTICLE;
CELL ISOLATION;
CELL MEMBRANE;
CHEMICAL MODIFICATION;
CONTROLLED STUDY;
ELECTRON SPIN RESONANCE;
LIPID ANALYSIS;
LIPID BILAYER;
LIPID COMPOSITION;
LIPID VESICLE;
MEMBRANE PERMEABILITY;
MEMBRANE VESICLE;
MODEL;
NONHUMAN;
PHYSICAL CHEMISTRY;
PLANT GROWTH;
PLANT ROOT;
PRIORITY JOURNAL;
ROOT CELL;
SEPARATION TECHNIQUE;
STRESS;
WHEAT;
CELL MEMBRANE;
CELL MEMBRANE PERMEABILITY;
COPPER;
COPPER SULFATE;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
MEMBRANE LIPIDS;
OXIDATIVE STRESS;
PLANT ROOTS;
SPIN LABELS;
TRITICUM;
TRITICUM AESTIVUM;
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EID: 0037206167
PISSN: 00052736
EISSN: None
Source Type: Journal
DOI: 10.1016/S0005-2736(02)00498-4 Document Type: Article |
Times cited : (26)
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References (25)
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