Electrical impedance spectroscopy characterisation of conducting membranes II. Experimental

Journal of Membrane Science

Volumn 195, Issue 2, 2002, Pages 169-180

  Gaedt, L ^a   Chilcott, T C ^a   Chan, M ^a   Nantawisarakul, T ^a,b   Fane, A G ^a   Coster, H G L ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b KING MONGKUT'S UNIVERSITY OF TECHNOLOGY NORTH BANGKOK   (Thailand)

Author keywords

Conducting membrane; Double layer; Impedance spectroscopy; Metal coat; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISPERSIONS; ELECTRODES; PLATINUM; POLYSULFONES; POROSITY; SCANNING ELECTRON MICROSCOPY; SPUTTER DEPOSITION; SURFACE ROUGHNESS; ULTRAFILTRATION;

CONDUCTING MEMBRANES; ELECTRICAL IMPEDANCE SPECTROSCOPY (EIS);

POLYMERIC MEMBRANES;

PLATINUM; POLYSULFONE;

CONDUCTION; MEMBRANE; SEPARATION; SPECTROSCOPY; SURFACE ROUGHNESS;

ALTERNATING CURRENT; ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRODE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; IMPEDANCE; MEMBRANE; MEMBRANE MODEL; POROSITY; PRIORITY JOURNAL; SPECTROSCOPY; SURFACE PROPERTY; ULTRAFILTRATION; WATER FLOW;

EID: 0037203562     PISSN: 03767388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0376-7388(01)00542-7     Document Type: Article

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