Initial chemical transport of reducing elements and chemical reactions in oxide cathode base metal

Applied Surface Science

Volumn 201, Issue 1-4, 2002, Pages 85-95

  Roquais, J M ^a   Poret, F ^a   Le Doze, R ^a   Dufour, P ^b   Steinbrunn, A ^b  

^a Laboratoire d'Optique Electronique   (France)

^b UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

Annealing; Grain boundary diffusion; Interfacial compounds; MgAl 2 O 4; MgO; Nickel; Oxide coated cathode; Al 2 O 3

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CATHODES; DEPOSITION; DIFFUSION IN SOLIDS; EMISSION SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; MAGNESIUM COMPOUNDS; NICKEL; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GDOES);

SURFACE REACTIONS;

EID: 0037202578     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00548-2     Document Type: Article

References (6)

1. Eisenstein A., John H., Affleck H. J. Appl. Phys. 24 1953 631.
2. Provisor H. Vide 15 1960 151.
3. Colin F. Revue Internationale des Hautes Températures et des Réfractaires 5 1968 269.
4. Berneron R. Spectrochim. Acta Part B: Atomic Spectrosc. 33 1978 665.
5. Allison H.W., Samelson H. J. Appl. Phys. 9 1959 1419.
6. J. Philibert, Atom Movements - Diffusion and Mass Transport in Solids, Les Ulis, Les Editions de la Physique, 1991.