-
1
-
-
0031550452
-
Emission properties of top-layer scandate cathodes prepared by LAD
-
Gaertner G., Geittner P., Lydtin H., Ritz A. Emission properties of top-layer scandate cathodes prepared by LAD Appl. Surf. Sci. 111 1997 11-17.
-
(1997)
Appl. Surf. Sci.
, vol.111
, pp. 11-17
-
-
Gaertner, G.1
Geittner, P.2
Lydtin, H.3
Ritz, A.4
-
3
-
-
0343757809
-
Dynamic shielding during ion bombardment of Ba dispenser cathodes
-
Gaertner G., Geittner P., Raasch D., Ritz A., Wiechert D.U. Dynamic shielding during ion bombardment of Ba dispenser cathodes Appl. Surf. Sci. 146 1999 12-16.
-
(1999)
Appl. Surf. Sci.
, vol.146
, pp. 12-16
-
-
Gaertner, G.1
Geittner, P.2
Raasch, D.3
Ritz, A.4
Wiechert, D.U.5
-
4
-
-
0032679189
-
Investigation of pulsed laser depositing Sc-coated cathode
-
Wang Y., Pan T. Investigation of pulsed laser depositing Sc-coated cathode Appl. Surf. Sci. 146 1999 62-68.
-
(1999)
Appl. Surf. Sci.
, vol.146
, pp. 62-68
-
-
Wang, Y.1
Pan, T.2
-
6
-
-
0011321138
-
Low temperature thermionic cathodes for CRTs and FPDs
-
G. Gaertner, P. Geittner, D. Raasch, U. Schiebel, Low temperature thermionic cathodes for CRTs and FPDs, in: Proceedings of the Eurodisplay, 1999, pp. 283-288.
-
(1999)
Proceedings of the Eurodisplay
, pp. 283-288
-
-
Gaertner, G.1
Geittner, P.2
Raasch, D.3
Schiebel, U.4
-
7
-
-
0342472277
-
-
Low temperature properties of Ba dispenser cathodes, in: Proceedings of the IVMC 1999, Technical Digest, Vols. 190 and 191
-
P. Geittner, G. Gaertner, D. Raasch, Low temperature properties of Ba dispenser cathodes, in: Proceedings of the IVMC 1999, Technical Digest, Vols. 190 and 191. J. Vac. Sci. Technol. B, 18 (2) (2000) 999-997.
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, Issue.2
, pp. 999-997
-
-
Geittner, P.1
Gaertner, G.2
Raasch, D.3
-
8
-
-
0034155767
-
-
Ba losses due to oxygen adsorption on Ba dispenser cathodes, in: Proceedings of the IVMC 1999, Technical Digest, Vols. 192 and 193
-
D. Raasch, P. Geittner, G. Gaertner, Ba losses due to oxygen adsorption on Ba dispenser cathodes, in: Proceedings of the IVMC 1999, Technical Digest, Vols. 192 and 193. J. Vac. Sci. Technol. B, 18 (2) (2000) 1000-1002.
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, Issue.2
, pp. 1000-1002
-
-
Raasch, D.1
Geittner, P.2
Gaertner, G.3
-
9
-
-
4244001983
-
Surface coverage, electron emission and dynamic substrate shielding during ion bombardment of thermionic dispenser cathodes
-
R. Cortenraad, A. van der Gon, H. Brongersma, A. Manenschijn, G. Gaertner, D. Raasch, Surface coverage, electron emission and dynamic substrate shielding during ion bombardment of thermionic dispenser cathodes, Tech. Digest IVESC, 2000, p. C1.
-
(2000)
Tech. Digest IVESC
-
-
Cortenraad, R.1
Van der Gon, A.2
Brongersma, H.3
Manenschijn, A.4
Gaertner, G.5
Raasch, D.6
-
10
-
-
0032586251
-
Refining the application of Fowler-Nordheim theory
-
Forbes R.G. Refining the application of Fowler-Nordheim theory Ultramicroscopy 79 1999 11-23.
-
(1999)
Ultramicroscopy
, vol.79
, pp. 11-23
-
-
Forbes, R.G.1
-
11
-
-
0011290287
-
Analysis of Fowler-Nordheim plots from non-metallic emitters
-
Darmstadt
-
R.G. Forbes, Analysis of Fowler-Nordheim plots from non-metallic emitters, Tech. Digest IVMC 1999, Darmstadt, 1999, pp. 118-119.
-
(1999)
Tech. Digest IVMC 1999
, pp. 118-119
-
-
Forbes, R.G.1
-
12
-
-
0011333734
-
Revised interpretation of the Fowler-Nordheim plot
-
Darmstadt
-
C.J. Edgcombe, Revised interpretation of the Fowler-Nordheim plot, Tech. Digest IVMC 1999, Darmstadt, 1999, pp. 114-115.
-
(1999)
Tech. Digest IVMC 1999
, pp. 114-115
-
-
Edgcombe, C.J.1
-
13
-
-
4243283763
-
Empirical relation between slope and intercept of Fowler-Nordheim plot for deposited field emitters: Seppen-Katamuki chart for estimation of field emitters
-
Y. Gotoh, H. Tsuji, J. Ishikawa, Empirical relation between slope and intercept of Fowler-Nordheim plot for deposited field emitters: Seppen-Katamuki chart for estimation of field emitters, Tech. Digest IVESC, 2000, p. B5.
-
(2000)
Tech. Digest IVESC
-
-
Gotoh, Y.1
Tsuji, H.2
Ishikawa, J.3
-
14
-
-
4243334270
-
Study of the field emission characteristics of carbon with the scanning atom probe
-
M. Watanabe, K. Tanaka, O. Nishikawa, T. Yamaguchi, N. Choi, H. Tokumoto, Study of the field emission characteristics of carbon with the scanning atom probe, Tech. Digest IVESC, 2000, p. F3.
-
(2000)
Tech. Digest IVESC
-
-
Watanabe, M.1
Tanaka, K.2
Nishikawa, O.3
Yamaguchi, T.4
Choi, N.5
Tokumoto, H.6
-
15
-
-
85061690608
-
Steady state emission from semiconducting cathodes
-
G. Bilbro, Steady state emission from semiconducting cathodes, Tech. Digest of IVESC, 2000, p. A4.
-
(2000)
Tech. Digest of IVESC
-
-
Bilbro, G.1
|