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Volumn 101, Issue 1-2, 2002, Pages 156-159

Silicon glass anodic bonding under partial vacuum conditions: Problems and solutions

Author keywords

Anodic bonding; Electrostatic bonding; MEMS technology; Silicon glass bonding; Vacuum sealing

Indexed keywords

ALUMINUM; BONDING; GLASS; MICROELECTROMECHANICAL DEVICES; SILICON WAFERS; VACUUM APPLICATIONS;

EID: 0037201886     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(02)00196-6     Document Type: Article
Times cited : (17)

References (12)
  • 1
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    • Wallis, G.1    Pomerantz, D.2
  • 3
    • 0025419816 scopus 로고
    • The mechanism of field-assisted silicon-glass bonding
    • Y. Kanda, K. Matsuda, C. Marayama, J. Sugaya, The mechanism of field-assisted silicon-glass bonding, Sens. Actuators A A21-A23 (1990) 939-943.
    • (1990) Sens. Actuators A , vol.A21-A23 , pp. 939-943
    • Kanda, Y.1    Matsuda, K.2    Marayama, C.3    Sugaya, J.4
  • 4
    • 0029325927 scopus 로고
    • Characterization of the electrostatic bonding of silicon and Pyrex glass
    • A. Cozma, B. Puers, Characterization of the electrostatic bonding of silicon and Pyrex glass, J. Micromech. Microeng. 5 (1995) 98-102.
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 98-102
    • Cozma, A.1    Puers, B.2
  • 5
    • 0029234140 scopus 로고
    • Selection of glass, anodic bonding conditions and material compatibility for silicon-glass capacitive sensors
    • T. Rogers, J. Koval, Selection of glass, anodic bonding conditions and material compatibility for silicon-glass capacitive sensors, Sens. Actuators 46/47 (1995) 113-120.
    • (1995) Sens. Actuators , vol.46-47 , pp. 113-120
    • Rogers, T.1    Koval, J.2
  • 6
    • 0031145706 scopus 로고    scopus 로고
    • Non-destructive in situ test for anodic bonding
    • J. Plaza, J. Esteve, E. Lora-Tamayo, Non-destructive in situ test for anodic bonding, Sens. Actuators A 60 (1997) 176-180.
    • (1997) Sens. Actuators A , vol.60 , pp. 176-180
    • Plaza, J.1    Esteve, J.2    Lora-Tamayo, E.3
  • 9
    • 0032093393 scopus 로고    scopus 로고
    • Electrical characterization of anodically bonded wafers
    • A. Cosma, H. Jakobsen, R. Puers, Electrical characterization of anodically bonded wafers, J. Micromech. Microeng. 8 (1998) 69-73.
    • (1998) J. Micromech. Microeng. , vol.8 , pp. 69-73
    • Cosma, A.1    Jakobsen, H.2    Puers, R.3
  • 12
    • 0033751490 scopus 로고    scopus 로고
    • Glass-to-glass anodic bonding with standard IC technology thin films as intermediate layers
    • A. Berthold, L. Nicola, P. Sarro, M. Wellekoop, Glass-to-glass anodic bonding with standard IC technology thin films as intermediate layers, Sens. Actuators A 82 (2000) 224-228.
    • (2000) Sens. Actuators A , vol.82 , pp. 224-228
    • Berthold, A.1    Nicola, L.2    Sarro, P.3    Wellekoop, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.