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Volumn 91-92, Issue , 2002, Pages 123-127
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Optical and structural characterization of LP MOVPE grown lattice matched InGaP/GaAs heterostructures
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Author keywords
CuPt type order; InGaP; MicroRaman; Photoluminescence mapping; X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
HETEROJUNCTIONS;
LOW TEMPERATURE EFFECTS;
METALLORGANIC VAPOR PHASE EPITAXY;
PHOTOLUMINESCENCE;
RAMAN SCATTERING;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
PHOTOLUMINESCENCE MAPPINGS;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
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EID: 0037197462
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(01)00968-0 Document Type: Conference Paper |
Times cited : (4)
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References (12)
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