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Volumn 35, Issue 16, 2002, Pages 3557-3573

Stark broadening and shift measurements of visible Si II lines

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DISCHARGE LAMPS; IONIZATION; MIXTURES; PLASMAS; SILICON; SPECTRUM ANALYSIS;

EID: 0037189958     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/35/16/314     Document Type: Article
Times cited : (24)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.