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Volumn 35, Issue 16, 2002, Pages 3557-3573
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Stark broadening and shift measurements of visible Si II lines
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
DISCHARGE LAMPS;
IONIZATION;
MIXTURES;
PLASMAS;
SILICON;
SPECTRUM ANALYSIS;
STARK BROADENING;
ASTROPHYSICS;
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EID: 0037189958
PISSN: 09534075
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-4075/35/16/314 Document Type: Article |
Times cited : (24)
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References (36)
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