A study of thin film Au-Al alloy oxidation in ambient air by X-ray photoelectron spectroscopy (XPS), X-ray absorption near edge structure (XANES), and secondary ion mass spectrometry (SIMS)

Applied Surface Science

Volumn 187, Issue 3-4, 2002, Pages 266-274

  Piao, H ^a   Suominen Fuller, M ^a   Miller, D ^a   McIntyre, N S ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Al L2,3 edge; Au Al alloy; Oxide growth; SIMS; XANES; XPS

Indexed keywords

CRYSTAL MICROSTRUCTURE; GOLD ALLOYS; PHASE TRANSITIONS; SECONDARY ION MASS SPECTROMETRY; THIN FILMS; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

X-RAY ABSORPTION NEAR EDGE STRUCTURE (XANES);

OXIDATION;

EID: 0037186026     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)01038-8     Document Type: Article

References (8)