Laser ablation and static secondary ion mass spectrometry capabilities in the characterization of inorganic materials

Applied Surface Science

Volumn 186, Issue 1-4, 2002, Pages 315-321

  Aubriet, Frédéric ^a,b   Poleunis, Claude ^a   Chaoui, Nouari ^b   Maunit, Benoît ^b   Millon, Eric ^b   Muller, Jean François ^b   Bertrand, Patrick ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b UNIVERSITÉ DE LORRAINE   (France)

Author keywords

Cluster ions; LA FTICRMS; Mass spectrometry; ToF SIMS; UV laser ablation

Indexed keywords

BINARY MIXTURES; CHARACTERIZATION; IONS; LASER DIAGNOSTICS; PULSED LASER DEPOSITION; SECONDARY ION MASS SPECTROMETRY; SOLID STATE PHYSICS; SPUTTERING; SURFACE CHEMISTRY; TERNARY SYSTEMS;

COMPLEX GAS PHASE REACTIONS;

INORGANIC COMPOUNDS;

EID: 0037185132     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00608-0     Document Type: Conference Paper

References (11)