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Volumn 37, Issue 13, 2002, Pages 2077-2083

Synthesis, structure and dielectric characterization of Ln2Ti2-2xM2xO7(Ln = Gd, Er; M = Zr, Sn, Si)

Author keywords

A. Ceramics; A. Oxides; D. Dielectric properties

Indexed keywords

CERAMIC MATERIALS; DIELECTRIC LOSSES; PERMITTIVITY; SOLID SOLUTIONS; STOICHIOMETRY; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

EID: 0037184302     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(02)00928-5     Document Type: Article
Times cited : (19)

References (19)
  • 7
    • 0000111005 scopus 로고
    • Influence of structural defects on the dielectric properties of ceramic microwave resonators
    • T. Negas, H. Ling (Eds.), American Ceramic Society, Westerville
    • P.K. Davies, Influence of structural defects on the dielectric properties of ceramic microwave resonators, in: T. Negas, H. Ling (Eds.), Materials and Processes for Wireless Communications, American Ceramic Society, Westerville, 1995, p. 137.
    • (1995) Materials and Processes for Wireless Communications , pp. 137
    • Davies, P.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.