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Electrochimica Acta

Volumn 47, Issue 19, 2002, Pages 3131-3136

X-ray absorption near edge structure and X-ray photoelectron spectroscopy studies of chloride in passive oxide films

(4) Natishan, P M a Yu, S Y a O'Grady, W E a Ramaker, D E a,b

a NAVAL RESEARCH LABORATORY (United States)

b GEORGE WASHINGTON UNIVERSITY (United States)

Author keywords

Oxide film; Passivity; Pitting corrosion; X ray absorption near edge structure; X ray photoelectron spectroscopy

Indexed keywords

ABSORPTION; ALUMINUM; DETECTORS; FLUORESCENCE; PASSIVATION; PITTING; X RAY PHOTOELECTRON SPECTROSCOPY;

PASSIVE OXIDE FILMS;

PROTECTIVE COATINGS;

EID: 0037183291 PISSN: 00134686 EISSN: None Source Type: Journal
DOI: 10.1016/S0013-4686(02)00232-3 Document Type: Article

Times cited : (27)

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