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Volumn 67, Issue 3-4, 2002, Pages 583-588
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Microstructural characterization of iron thin films prepared by sputtering at very low temperatures
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Author keywords
Magnetic exchange field; Nanocrystalline iron
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL MICROSTRUCTURE;
IRON;
LOW TEMPERATURE EFFECTS;
OXIDATION;
SILICON WAFERS;
SPUTTERING;
X RAY SPECTROSCOPY;
X-RAY ABSORPTION SPECTROSCOPY;
THIN FILMS;
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EID: 0037179762
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0042-207X(02)00252-X Document Type: Conference Paper |
Times cited : (3)
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References (16)
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