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Volumn 67, Issue 3-4, 2002, Pages 583-588

Microstructural characterization of iron thin films prepared by sputtering at very low temperatures

Author keywords

Magnetic exchange field; Nanocrystalline iron

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; IRON; LOW TEMPERATURE EFFECTS; OXIDATION; SILICON WAFERS; SPUTTERING; X RAY SPECTROSCOPY;

EID: 0037179762     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(02)00252-X     Document Type: Conference Paper
Times cited : (3)

References (16)
  • 7
    • 0004219595 scopus 로고
    • Berkowitz AE, Kneller E, editors. New York: Academic Press
    • Kneller E. in: Berkowitz AE, Kneller E, editors. Magnetism and metallurgy. New York: Academic Press, 1969.
    • (1969) Magnetism and metallurgy
    • Kneller, E.1
  • 13
    • 0004036113 scopus 로고
    • Berlin: Springer
    • Teo B.K. EXAFS. Basic principles and data analysis. 1986;Springer, Berlin, Koningsberger D.C., Prins R. X-ray absortion principles, applications, techniques of EXAFS, SEXAFS and XANES. 1988;Wiley, New York.
    • (1986) EXAFS. Basic principles and data analysis
    • Teo, B.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.