In-situ X-ray diffraction study about uniaxial deformation behavior in a copper single crystal

Materials Science and Engineering: A

Volumn 335, Issue 1-2, 2002, Pages 309-312

  Kim, K H ^a   Koo, Y M ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Copper; Reflection laue method; Schmid factor; Single crystal; Slip system

Indexed keywords

COPPER; DEFORMATION; REFLECTION; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

SLIP LINE MEASUREMENT;

SINGLE CRYSTALS;

COPPER;

EID: 0037174226     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01943-8     Document Type: Article

References (12)