Beam profile imaging target

Nuclear Physics A

Volumn 701, Issue 1-4, 2002, Pages 204-208

  Pugatch, V ^a   Knopfle K T ^a   Vassiliyev, Yu ^b  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^b TU DORTMUND UNIVERSITY   (Germany)

Author keywords

Beam profile; Charge integrator; Secondary and electron emission

Indexed keywords

EID: 0037156655     PISSN: 03759474     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9474(01)01575-5     Document Type: Article

References (8)