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Volumn 407, Issue 1-2, 2002, Pages 163-168

Effects of pressure on the cleaning action of cathode spot in low vacuum

Author keywords

Arc; Cathode; Low vacuum; Surface cleaning; Surface roughness

Indexed keywords

CATHODES; ELECTRIC ARCS; OXIDES; PRESSURE EFFECTS; SURFACE ROUGHNESS; VACUUM;

EID: 0037155435     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00032-9     Document Type: Conference Paper
Times cited : (24)

References (7)
  • 1
    • 0006029999 scopus 로고    scopus 로고
    • Arifov Institute of Electronics, Patent Application, JP N2221389, filed 24 Aug. (1990)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.