Operational trends in the temperature of a high-pressure microwave powered sulfur lamp

Journal of Physics D: Applied Physics

Volumn 35, Issue 20, 2002, Pages 2578-2585

  Johnston, C W ^a   Jonkers, J ^a   Van Der Mullen, J J A M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; ELECTRIC LAMPS; HIGH PRESSURE EFFECTS; SPECTROSCOPY; SULFUR; TEMPERATURE MEASUREMENT;

HIGH PRESSURE MICROWAVE POWERED SULFUR LAMP; SULFUR ATOMIC LINES;

MICROWAVE DEVICES;

EID: 0037152684     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/20/317     Document Type: Article

References (5)

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2. van der Heijden H and van der Mullen J J A M 2001, J. Phys. At. Mol. Opt. Phys. 34 4183
3. Peterson D A and Schlie L A 1980 J. Chem. Phys. 73 4
4. van Dongen M et al 1999 J. Phys. D: Appl. Phys. 31 3095
5. Wiese W L, Smith M W and Miles B M 1966 Atomic transition probabilities Natl. Stand. Ref. Data Ser. Natl. Bur. Stad., Circ. 4 (U.S.GPO, Washington, DC, 1966) vol 1