The determination of relaxation parameters and their distributions using thermally stimulated discharge current measurements

Journal of Physics D: Applied Physics

Volumn 35, Issue 18, 2002, Pages 2298-2303

  Neagu, Eugen R ^a   Neagu, Radu ^b  

^a UNIVERSIDADE NOVA DE LISBOA   (Portugal)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC DISCHARGES; PARAMETER ESTIMATION; THERMAL EFFECTS;

THERMOGRAMS;

DIELECTRIC RELAXATION;

EID: 0037151987     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/18/311     Document Type: Article

References (23)

1. Bucci C., Fieschi R. and Guidi G. 1966 Phys. Rev. 148 816.
2. Van Turnhout J. 1975 Thermally Stimulated Discharge of Polymer Electrets (Amsterdam: Elsevier).
3. Chen R. 1977 J. Electrostatics 3 15.
4. Vanderschueren J. and Gasiot J. 1979 Thermally Stimulated Relaxation in Solids vol 37, ed P Braunlich (Berlin: Springer) ch 4.
5. Jonscher A.K. 1996 Universal Relaxation Law (London: Chelsea Dielectrics).
6. Neagu E.R., Marat-Mendes J.N., Das-Gupta D.K., Neagu R.M. and Igreja R. 1997 J. Appl. Phys. 82 2488.
7. Neagu E.R., Marat-Mendes J.N., Neagu R.M. and Das-Gupta D.K. 1999 J. Appl. Phys. 85 2330.
8. Neagu E.R. and Neagu R.M. 2000 Thin Solid Films 358 283.
9. Neagu R.M., Neagu E.R., Kalogeras I.M. and Vassilikou-Dova A. 2001 Mat. Res. Innovat. 4 115.
10. Mano J.F. 1998 J. Phys, D: Appl. Phys. 31 2898.
11. Henn F., Vanderschueren J., Giuntini J.C. and Zanchetta J.V. 1999 J. Appl. Phys. 85 2821.
12. Halpern V. 1997 J. Phys. D: Appl. Phys. 30 458.
13. Sauer B.B. and Avakian P. 1992 Polymer 33 5128.
14. Aldana M., Laredo E., Bello A. and Suarez N. 1994 J. Polym. Sci., Polym. Phys. 32 2197.
15. Ngai K.L. 1979 Comment. Solid State Phys. 9 127.
16. Bässler H. 1993 Phys. Status Solidi b 175 15.
17. Lewis T.J. 1998 Space Charge in Solid Dielectrics ed J.C. Fothergill and L.A. Dissado (The Dielectric Society) pp 1-17.
18. Wolf U., Arkhipov V.I. and Bässler H. 1999 Phys. Rev. B 59 7507.
19. Teyssedre G. and Lacabanne C. 1995 J. Phys. D: Appl. Phys. 28 1478.
20. Lavergne C. and Lacabanne C. 1993 IEEE Elec. Insul. Mag. 9 5.
21. Bevington P.R. 1972 Data Reduction and Error Analysis for the Physical Sciences (New York: McGraw-Hill).
22. Neagu R.M., Neagu E.R., Bonanos N., Kyritsis A. and Pissis P. 1999 Proc. 10th Int. Symp. Electrets (Delphi, 1999) ed A.A. Konsta, A. Vassilikou-Dova and K. Vartzeli-Nikaki (New York: IEEE) pp 671-4.
23. Neagu R.M., Neagu E.R., Kyritsis A. and Pissis P. 2000 J. Phys. D: Appl. Phys. 33 1921.