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Applied Surface Science

Volumn 194, Issue 1-4, 2002, Pages 200-209

Microscopes/microprobes

a BUNDESWEHR UNIVERSITY MUNICH (Germany)

Author keywords

Fatigue crack; Image of defects; Positron microscopy; Radiation damage; Superresolution; Vacancy clusters

Indexed keywords

CRACKS; CRYSTAL DEFECTS; ELECTRON BEAMS; FATIGUE OF MATERIALS; MICROSCOPES; PROBES; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

MICROPROBES; VACANCY CLUSTERS;

POSITRONS;

EID: 0037150985 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(02)00102-2 Document Type: Conference Paper

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.