Overall comparison of subpicosecond electron beam diagnostics by the polychromator, the interferometer and the femtosecond streak camera

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 480, Issue 2-3, 2002, Pages 315-327

  Watanabe, T ^a   Sugahara, J ^a   Yoshii, K ^a   Ueda, T ^a   Uesaka, M ^a   Yoshimatsu, T ^b   Kondo, Y ^b   Sasaki, S ^b   Sugiyama, Y ^b   Ishi, K ^b   Shibata, Y ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Coherent; Diagnostics; Electron beam; Interferometer; Polychromator; Subpicosecond

Indexed keywords

DIFFRACTION; INTERFEROMETERS; PARTICLE ACCELERATORS; STREAK CAMERAS;

POLYCHROMATORS;

ELECTRON BEAMS;

EID: 0037149306     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00952-4     Document Type: Article

References (25)

1. Photoelectric devices