Development of a surface roughness measurement system using reflected laser beam

Journal of Materials Processing Technology

Volumn 130-131, Issue , 2002, Pages 662-667

  Kim, H Y ^a   Shen, Y F ^a   Ahn, J H ^a  

^a Pusan National University   (South Korea)

Author keywords

A scattered light pattern; On the machine measurement; Surface roughness

Indexed keywords

LASER BEAMS; LIGHT REFLECTION; LIGHT SCATTERING; ROUGHNESS MEASUREMENT;

LIGHT PATTERNS;

SURFACE ROUGHNESS;

EID: 0037146973     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(02)00731-8     Document Type: Conference Paper

References (8)

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