Polarization opposition effect and second-order ray tracing

Applied Optics

Volumn 41, Issue 24, 2002, Pages 5115-5121

  Videen, Gorden ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; MONTE CARLO METHODS; OPTICAL PROPERTIES; PHOTOMETRY; RAY TRACING;

POLARIZATION OPPOSITION EFFECT; SECOND-ORDER RAY TRACING;

LIGHT POLARIZATION;

EID: 0037143907     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.005115     Document Type: Article

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