Crystal-chemical study by XANES of trioctahedral micas: The most characteristic layer silicates

International Journal of Modern Physics B

Volumn 16, Issue 11-12, 2002, Pages 1673-1679

  Tombolini, F ^a   Marcelli, A ^a   Mottana, A ^a,b   Cibin, G ^a   Brigatti, M F ^c   Giuli, G ^d  

^a INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^b ROMA TRE UNIVERSITY   (Italy)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^d UNIVERSITY OF CAMERINO   (Italy)

Author keywords

Aluminium; Silicon; Trioctahedral micas; XANES; XRD

Indexed keywords

ALUMINUM DERIVATIVE; METAL OXIDE; MICA; SILICON DERIVATIVE;

ARTICLE; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; ENERGY; GEOMETRY; ROTATION; SPECTROSCOPY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0037141377     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0217979202011081     Document Type: Article

References (5)