Removing aperture-induced artifacts from fourier transform infrared intensity values

Applied Optics

Volumn 41, Issue 15, 2002, Pages 2831-2839

  Johnson, Timothy J ^a   Sams, Robert L ^a   Blake, Thomas A ^a   Sharpe, Steven W ^a   Chu, Pamela M ^b  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; ERROR CORRECTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED DETECTORS; INFRARED RADIATION; INTERFEROMETERS; LIGHT MODULATION;

APERTURE-INDUCED ARTIFACTS;

LIGHT REFLECTION;

EID: 0037140643     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.002831     Document Type: Article

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