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Volumn 16, Issue 1-2, 2002, Pages 144-150

Studying non-uniform electrodeposition using the wire beam electrode method

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ANALYTIC METHOD; CONFERENCE PAPER; CORROSION; ELECTRIC CURRENT; ELECTROCHEMICAL ANALYSIS; ELECTRODE; ELECTROPLATING INDUSTRY; MATERIALS; MATHEMATICAL MODEL; NANOPARTICLE; PLATING MEDIUM; PROCESS OPTIMIZATION; WIRE BEAM ELECTRODE METHOD;

EID: 0037138083     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0217979202009573     Document Type: Conference Paper
Times cited : (13)

References (17)
  • 10
    • 0009475122 scopus 로고    scopus 로고
    • United States of America patent No. 6132593 (2000)
    • Tan, Y.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.