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Volumn 497, Issue 1-3, 2002, Pages 81-92

Thickness dependence on the surface morphology and the magnetic microstructure of La0.7Sr0.3MnO3 films under different strains

(3) Desfeux, R a Da Costa, A a Prellier, W b

a UNIVERSITÉ D'ARTOIS (France)

b LABORATOIRE CRISMAT (France)

Author keywords

Atomic force microscopy; Magnetic films; Magnetic measurements; Magnetic surfaces; Surface structure, morphology, roughness, and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; FERROMAGNETISM; FILM GROWTH; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; MAGNETIC DOMAINS; MAGNETIZATION; PULSED LASER DEPOSITION; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC THIN FILMS;

EID: 0037137917 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01628-4 Document Type: Article

Times cited : (13)

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