Pore-controlled proton conducting silica films

Advanced Materials

Volumn 14, Issue 12, 2002, Pages 912-914

  Li, H ^a   Nogami, M ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; FILM PREPARATION; INTERFACES (MATERIALS); PROTONS; REFRACTIVE INDEX; SELF ASSEMBLY; X RAY DIFFRACTION ANALYSIS;

PORE STRUCTURE; PROTON CONDUCTING SILICA FILMS; PROTON CONDUCTIVITY; SILICA FILMS; SURFACE PROFILOMETER;

SILICA;

EID: 0037130071     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(20020618)14:12<912::AID-ADMA912>3.0.CO;2-L     Document Type: Article

References (15)