Impact of erbium-doped silicon nanocrystals on the properties of polyphenylene vinylene films

Journal of Physical Chemistry B

Volumn 106, Issue 15, 2002, Pages 3860-3863

  Ji, Junmin ^a   Coffer, Jeffery L ^a  

^a TEXAS CHRISTIAN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE FILMS;

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTROLUMINESCENCE; ERBIUM; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; PLASTIC FILMS; PROFILOMETRY; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

SEMICONDUCTING POLYMERS;

EID: 0037129502     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0140670     Document Type: Article

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