SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 14, Issue 10, 2002, Pages 757-758

Measurements of solid-state photoluminescence quantum yields of films using a fluorimeter

(2) Palsson L O a Monkman, A P a

a DURHAM UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FLUOROMETERS; PHOTOLUMINESCENCE; SPECTROMETERS; SPIN COATING; SUBSTRATES;

SPECTROFLUORIMETERS;

THIN FILMS;

EID: 0037123546 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4095(20020517)14:10<757::AID-ADMA757>3.0.CO;2-Y Document Type: Article

Times cited : (267)

References (6)

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2
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3
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- (1994) J. Am. Chem. Soc. , vol.116 , pp. 4832
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4
- 0006008681
- in press
- J. Am. Chem. Soc.
- Monkman, A.P.¹ Pålsson, L.-O.² Higgins, R.W.T.³ Wang, C.⁴ Bryce, M.R.⁵ Batsanov, A.S.⁶ Howard, J.A.K.⁷

5
- 0006006614
- in press
- Chem. Phys.
- Rothe, C.¹ Pålsson, L.-O.² Monkman, A.P.³

6
- 0033897655
- (2000) Adv. Mater. , vol.12 , pp. 58
- Virgili, T.¹ Lidzey, D.G.² Bradley, D.D.C.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.