Microstructure evolution at a triple junction in polycrystalline silicon

Journal of Physics Condensed Matter

Volumn 14, Issue 48, 2002, Pages 13003-13008

  Satta, Alessandra ^a   Pisanu, Enrico ^a   Colombo, Luciano ^a   Cleri, Fabrizio ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b ENEA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FRACTURE; GRAIN BOUNDARIES; MICROCRACKS; MICROSTRUCTURE; MOLECULAR DYNAMICS; PHASE TRANSITIONS; SEMICONDUCTING SILICON;

BRITTLE-DUCTILE TRANSITION; EXTERNAL LOADING; POLYCRYSTALLLINE SILICON; STILLINGER-WEBER EMPIRICAL POTENTIAL; TRIPLE JUNCTION;

POLYCRYSTALLINE MATERIALS;

EID: 0037122110     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/48/344     Document Type: Article

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