A novel method to determine the diffusion coefficient of hydrogen ion in ruthenium oxide films

Chemical Physics Letters

Volumn 364, Issue 5-6, 2002, Pages 517-521

  Yu, George T ^a,b   Yen, S K ^b  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^b NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037120777     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(02)01399-4     Document Type: Article

References (11)

1. J.R. Collet Lacoste, Ph. D. thesis, University Paris-Sud, Orsay, 1993.
2. T. Zakroczymski, Scr. Met. 19 (1985) 521.
3. T. Zakroczymski, Z. Smialowska, J. Electrochem. Soc. 132 (1985) 2548.
4. M. Nagano, Y. Hayashi, N. Othani, M. Isshiki, K. Igaki, Trans. JIM 22 (1981) 423.
5. M. Nagano, Y. Hayashi, N. Othani, M. Isshiki, K. Igaki, Scr. Met. 16 (1982) 973.
6. S.I. Pyun, R.A. Oriani, Electrochim. Acta 36 (1991) 825.
7. I.R. Lauks, J.N. Zemel, IEEE Trans. Electron Dev. Ed-26 (1979) 1959.
8. M. Esashi, T. Matsuo, IEEE Trans. Biomed. Eng. BME-25 (1978) 184.
9. J. Shahtiar, L.S. Rosemary, IEEE Trans. Electron Dev. 45 (6) (1998) 1239.
10. J. Crank, The Mathematics of Diffusion, Oxford University Press, 1975.
11. J.A. Mihell, J.K. Atkinson, Sensors Actuators B 48 (1998) 505.