Standoff detection of chemicals using porous silicon "smart dust" particles

Advanced Materials

Volumn 14, Issue 18, 2002, Pages 1270-1272

  Schmedake, T A ^a   Cunin, F ^a   Link, J R ^a   Sailor, M J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ELECTROCHEMISTRY; ETCHING; HELIUM NEON LASERS; HYDROCARBONS; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; POROSITY; POROUS SILICON; REFRACTIVE INDEX; SEMICONDUCTING FILMS; VAPORS;

RUGATE REFLECTORS;

INTELLIGENT MATERIALS;

EID: 0037120346     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(20020916)14:18<1270::AID-ADMA1270>3.0.CO;2-R     Document Type: Article

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