-
2
-
-
0002742273
-
-
Clark R.J.H., Hester R.E., Eds.; Wiley: Chichester, U.K., The Selection Rules for Surface-Enhanced Raman Spectroscopy
-
Creighton, J.A. In Spectroscopy of Surfaces; Clark R.J.H., Hester R.E., Eds.; Wiley: Chichester, U.K., 1988; p 37 (The Selection Rules for Surface-Enhanced Raman Spectroscopy).
-
(1988)
Spectroscopy of Surfaces
, pp. 37
-
-
Creighton, J.A.1
-
3
-
-
0001642395
-
-
Otto, A.; Mrozek, I.; Grabhorn, H.; Akemann, W. J. Phys.: Condens. Matter 1992, 4, 1143.
-
(1992)
J. Phys.: Condens. Matter
, vol.4
, pp. 1143
-
-
Otto, A.1
Mrozek, I.2
Grabhorn, H.3
Akemann, W.4
-
4
-
-
0000944735
-
-
Chang, R.K., Furtak, T.E., Eds.; Plenum Press: New York, Molecule-Silver Separation Dependence
-
Murray, C.A. In Surface-Enhanced Raman Scattering; Chang, R.K., Furtak, T.E., Eds.; Plenum Press: New York, 1982; p 203 (Molecule-Silver Separation Dependence).
-
(1982)
Surface-Enhanced Raman Scattering
, vol.2
, pp. 203
-
-
Murray, C.A.1
-
5
-
-
0023862619
-
-
Moskovits, M.; DiLella, D.P.; Maynard, K.J. Langmuir 1988, 4, 67.
-
(1988)
Langmuir
, vol.4
, pp. 67
-
-
Moskovits, M.1
Dilella, D.P.2
Maynard, K.J.3
-
7
-
-
0000988072
-
-
(a) Arenas, J.F.; Woolley, M.S.; Otero, J.C.; Marcos, J.I. J. Phys. Chem. 1996, 100, 3199.
-
(1996)
J. Phys. Chem.
, vol.100
, pp. 3199
-
-
Arenas, J.F.1
Woolley, M.S.2
Otero, J.C.3
Marcos, J.I.4
-
8
-
-
0030134099
-
-
(b) Arenas, J.F.; López Tocón, I.; Otero, J.C.; Marcos, J.I. J. Phys. Chem. 1996, 100, 9254.
-
(1996)
J. Phys. Chem.
, vol.100
, pp. 9254
-
-
Arenas, J.F.1
López Tocón, I.2
Otero, J.C.3
Marcos, J.I.4
-
9
-
-
0542423201
-
-
(c) Arenas, J.F.; López Tocón, I.; Woolley, M.S.; Otero, J.C.; Marcos, J.I. J. Raman Spectrosc. 1998, 29, 673.
-
(1998)
J. Raman Spectrosc.
, vol.29
, pp. 673
-
-
Arenas, J.F.1
López Tocón, I.2
Woolley, M.S.3
Otero, J.C.4
Marcos, J.I.5
-
10
-
-
0001895123
-
-
(d) Arenas, J.F.; Woolley, M.S. López Tocón, I.; Otero, J.C.; Marcos, J.I. Vib. Spectrosc. 1999, 19, 213.
-
(1999)
Vib. Spectrosc.
, vol.19
, pp. 213
-
-
Arenas, J.F.1
Woolley, M.S.2
López Tocón, I.3
Otero, J.C.4
Marcos, J.I.5
-
11
-
-
0000202407
-
-
Arenas, J.F.; López Tocón, I.; Otero, J.C.; Marcos, J.I. J. Chem. Phys. 2000, 112, 7669.
-
(2000)
J. Chem. Phys.
, vol.112
, pp. 7669
-
-
Arenas, J.F.1
López Tocón, I.2
Otero, J.C.3
Marcos, J.I.4
-
13
-
-
26644441857
-
-
(a) Sass, J.K.; Neff, H.; Moskovits, M.; Holloway, S. J. Phys. Chem. 1981, 85, 621.
-
(1981)
J. Phys. Chem.
, vol.85
, pp. 621
-
-
Sass, J.K.1
Neff, H.2
Moskovits, M.3
Holloway, S.4
-
15
-
-
0344603561
-
-
Montañez, M.A.; López Tocón, I.; Otero, J.C.; Marcos, J.I. J. Mol. Struct. 1999, 482-483, 201.
-
(1999)
J. Mol. Struct.
, vol.482-483
, pp. 201
-
-
Montañez, M.A.1
López Tocón, I.2
Otero, J.C.3
Marcos, J.I.4
-
17
-
-
0004133516
-
-
Gaussian Inc.; Pittsburgh, PA
-
Frisch, M.J.; Trucks, G.W.; Schlegel, H.B.; Gill, P.M.W.; Johnson, B.G.; Robb, M.; Cheeseman, J.R.; Keith, T.A.; Petersson, G.A.; Montgomery, J.A.; Raghavachari, K.; Al-Laham, M.A.; Zakrzewski, V.G.; Ortiz, J.V.; Foresman, J.B.; Cioslowski, J.; Stefanow, B.B.; Nanayakkara, A.; Challacombe, M.; Peng, C.Y.; Ayala, P.Y.; Chen, W.; Wong, M.W.; Andres, J.; Reploge, E.S.; Gomperts, R.; Martin, R.L.; Fox, D.J.; Binkley, J.S.; Defrees, D.J.; Baker, J.; Steward, J.J.P.; Head-Gordon, M.; Gonzalez, C.; Pople, J.A. Gaussian 94, revision E.2; Gaussian Inc.; Pittsburgh, PA, 1995.
-
(1995)
Gaussian 94, revision E.2
-
-
Frisch, M.J.1
Trucks, G.W.2
Schlegel, H.B.3
Gill, P.M.W.4
Johnson, B.G.5
Robb, M.6
Cheeseman, J.R.7
Keith, T.A.8
Petersson, G.A.9
Montgomery, J.A.10
Raghavachari, K.11
Al-Laham, M.A.12
Zakrzewski, V.G.13
Ortiz, J.V.14
Foresman, J.B.15
Cioslowski, J.16
Stefanow, B.B.17
Nanayakkara, A.18
Challacombe, M.19
Peng, C.Y.20
Ayala, P.Y.21
Chen, W.22
Wong, M.W.23
Andres, J.24
Reploge, E.S.25
Gomperts, R.26
Martin, R.L.27
Fox, D.J.28
Binkley, J.S.29
Defrees, D.J.30
Baker, J.31
Steward, J.J.P.32
Head-Gordon, M.33
Gonzalez, C.34
Pople, J.A.35
more..
-
18
-
-
0002381078
-
-
Chang, R.K., Furtak, T.E., Eds.; Plenum Press: New York, The Adatom Model: How Important Is Atomic Scale Roughness?
-
Otto, A.; Pockrand, I.; Billmann, J.; Pettenkofer, C. In Surface-Enhanced Raman Scattering; Chang, R.K., Furtak, T.E., Eds.; Plenum Press: New York, 1982; p 147 (The Adatom Model: How Important Is Atomic Scale Roughness?).
-
(1982)
Surface-Enhanced Raman Scattering
, pp. 147
-
-
Otto, A.1
Pockrand, I.2
Billmann, J.3
Pettenkofer, C.4
-
19
-
-
0024922081
-
-
Dong, S.Y.; Wang, G.; Wang, W.; Zhang, Z.; Zheng, J. Appl. Phys. 1989, B49, 553.
-
(1989)
Appl. Phys.
, vol.B49
, pp. 553
-
-
Dong, S.Y.1
Wang, G.2
Wang, W.3
Zhang, Z.4
Zheng, J.5
-
20
-
-
0028424037
-
-
See for instance: Wedum, E.E.; Grant, E.R.; Cheng, P.Y.; Willey, K.F.; Duncan, M.A. J. Chem. Phys. 1994, 100, 6312.
-
(1994)
J. Chem. Phys.
, vol.100
, pp. 6312
-
-
Wedum, E.E.1
Grant, E.R.2
Cheng, P.Y.3
Willey, K.F.4
Duncan, M.A.5
|