Structural determination of two-dimensional YSi2 epitaxially grown on Si(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 23, 2002, Pages 2354211-2354217

  Rogero, C ^a   Polop, C ^a,c   Magaud, L ^b   Sacedon J L ^a   De Andres P L L ^a   Martin Gago J A ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ATOM; DENSITY; ELECTRON DIFFRACTION; GEOMETRY; MEASUREMENT; MOLECULAR DYNAMICS; STRUCTURE ANALYSIS; THEORETICAL MODEL;

EID: 0037116007     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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